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  Analysis of HMDS self-assembled monolayer Effect on Trap Density in PC70BM n-type Thin Film Transistors through Admittance Studies
 
 
Title: Analysis of HMDS self-assembled monolayer Effect on Trap Density in PC70BM n-type Thin Film Transistors through Admittance Studies
Author: Fiorillo, M.R.
Liguori, R.
Diletto, C.
Bezzeccheri, E.
Tassini, P.
Maglione, M.G.
Maddalena, P.
Minarini, C.
Rubino, A.
Appeared in: Materials today: proceedings
Paging: Volume 4 (2017) nr. 4PB pages 7 p.
Year: 2017
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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