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| Titel: |
Causes of Concentration Differences Between a Scanning Mobility Particle Sizer and a Condensation Particle Counter |
| Auteur: |
Liu, Peter S. K. Deshler, Terry |
| Verschenen in: |
Aerosol science and technology |
| Paginering: | Jaargang 37 (2003) nr. 11 pagina's 916-923 |
| Jaar: |
2003-11 |
| Inhoud: |
Accurate aerosol concentration measurement is important in many applications of aerosol science. Here we compare aerosol concentration measurements of classified NaCl aerosol in the size range of 20 to 80 nm (diameter) between a scanning mobility particle sizer (SMPS) and a condensation particle counter (CPC). The SMPS systematically measured higher concentrations than the CPC, with the difference increasing with decreasing particle size. Experiments suggest several causes for the discrepancy. First, the factory calibration of the SMPS impactor flow was incorrect for the study site at 780 mbar. Second, the neutralizer used in the SMPS was inefficient in bringing the classified aerosol to charge equilibrium, and third, there were significant losses of charged aerosol within the CPC. The comparisons were improved with proper impactor flow calibration and proper charge neutralization of the classified aerosol before measurement by the SMPS and CPC. The results of this study point to the importance of proper conditioning of aerosol below about 100 nm for measurement with the SMPS and condensation-based particle counters. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 3 van 8 gevonden artikelen
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