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                                       Details for article 12 of 22 found articles
 
 
  Electromigration in a Sn-3 wt.%Ag-0.5 wt.%Cu-3 wt.%Bi Solder Stripe Between Two Cu Electrodes Under Current Stressing
 
 
Title: Electromigration in a Sn-3 wt.%Ag-0.5 wt.%Cu-3 wt.%Bi Solder Stripe Between Two Cu Electrodes Under Current Stressing
Author: Lee, Shang-Hua
Chen, Chih-Ming
Appeared in: Journal of electronic materials
Paging: Volume 40 (2011) nr. 9 pages 1943-1949
Year: 2011
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 22 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands