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  Critical Current Density for Inhibiting (Cu,Ni)6Sn5 Formation on the Ni Side of Cu/Solder/Ni Joints
 
 
Title: Critical Current Density for Inhibiting (Cu,Ni)6Sn5 Formation on the Ni Side of Cu/Solder/Ni Joints
Author: Wu, W. H.
Chung, H. L.
Chen, B. Z.
Ho, C. E.
Appeared in: Journal of electronic materials
Paging: Volume 39 (2010) nr. 12 pages 2653-2661
Year: 2010
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 30 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands