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Journal description
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Details for article 3 of 23 found articles
| Title: |
Characterization of Ge22Sb22Te56 and Sb-Excess Ge15Sb47Te38 Chalcogenide Thin Films for Phase-Change Memory Applications |
| Author: |
Ryu, Sang-Ouk |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 37 (2008) nr. 4 pages 535-539 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 23 found articles
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