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Journal description
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Details for article 39 of 40 found articles
| Title: |
Thickness determination of low doped SiC epi-films on highly doped SiC substrates |
| Author: |
Macmillan, M. F. Henry, A. Janzén, E. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 27 (1998) nr. 4 pages 300-303 |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Springer-Verlag, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 40 found articles
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