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Journal description
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Details for article 38 of 40 found articles
| Title: |
The effects of reactive ion etching-induced damage on the characteristics of ohmic contacts to n-Type GaN |
| Author: |
Ping, A. T. Chen, Q. Yang, J. W. Khan, M. Asif Adesida, I. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 27 (1998) nr. 4 pages 261-265 |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Springer-Verlag, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 38 of 40 found articles
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