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Journal description
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Details for article 39 of 40 found articles
| Title: |
Use of negative capacitance to simulate the electrical characteristics in double-gate ferroelectric field-effect transistors |
| Author: |
Xiao, Y.G. Tang, M.H. Xiong, Y. Li, J.C. Cheng, C.P. Jiang, B. Cai, H.Q. Tang, Z.H. Lv, X.S. Gu, X.C. Zhou, Y.C. |
| Appeared in: |
Current applied physics |
| Paging: | Volume 12 (2012) nr. 6 pages 5 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 40 found articles
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