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Journal description
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Details for article 3 of 52 found articles
| Title: |
Characterization by X-ray diffraction and electron microscopy of GaInAs and GaAsN single layers and quantum wells grown on GaAs |
| Author: |
Varlet, H Curtil, C Alfonso, C Burle, N Arnoult, A Fontaine, C Laügt, M |
| Appeared in: |
Physica. E, Low-dimensional systems and nanostructures |
| Paging: | Volume 23 (2004) nr. 3-4 pages 8 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 52 found articles
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