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Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range |
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Titel: |
Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range |
Auteur: |
Aruev, P.N. Kolokolnikov, Yu.M. Kovalenko, N.V. Legkodymov, A.A. Lyakh, V.V. Nikolenko, A.D. Pindyurin, V.F. Sukhanov, V.L. Zabrodsky, V.V. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 603 (2009) nr. 1-2 pagina's 4 p. |
Jaar: |
2009 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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