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                                       Details for article 39 of 39 found articles
 
 
  Three-dimensional thermal-spike modeling of ion charge-state dependence on sputtering yield in silicon dioxide thin films under MeV heavy-ion irradiation
 
 
Title: Three-dimensional thermal-spike modeling of ion charge-state dependence on sputtering yield in silicon dioxide thin films under MeV heavy-ion irradiation
Author: Mammeri, S.
Boubir, A.
Salhi, M.
Saad, M.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 566 () nr. C pages p.
Year: 2025
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 39 of 39 found articles
 
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