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Characteristics of secondary ions and their impact on single-event upset in TMD devices under proton irradiation |
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Titel: |
Characteristics of secondary ions and their impact on single-event upset in TMD devices under proton irradiation |
Auteur: |
Ye, Bing Cai, Li Ni, Fafu Zeng, Jian Wu, Zhaoxi Luo, Jie Zhai, Pengfei Yan, Xiaoyu Sun, Youmei Liu, Jie |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 547 () nr. C pagina's p. |
Jaar: |
2024 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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