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Characteristics of secondary ions and their impact on single-event upset in TMD devices under proton irradiation |
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Title: |
Characteristics of secondary ions and their impact on single-event upset in TMD devices under proton irradiation |
Author: |
Ye, Bing Cai, Li Ni, Fafu Zeng, Jian Wu, Zhaoxi Luo, Jie Zhai, Pengfei Yan, Xiaoyu Sun, Youmei Liu, Jie |
Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paging: |
Volume 547 () nr. C pages p. |
Year: |
2024 |
Contents: |
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Publisher: |
Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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