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Journal description
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Details for article 139 of 178 found articles
| Title: |
RBS analysis of beam-processed microarea by focused MeV ion beam |
| Author: |
Kinomura, A. Takai, M. Matsuo, T. Ujiie, S. Namba, S. Satou, M. Kiuchi, M. Fujii, K. Shiokawa, T. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 39 (1989) nr. 1-4 pages 3 p. |
| Year: |
1989 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 139 of 178 found articles
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