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                                       Details for article 73 of 77 found articles
 
 
  Thermal spike model interpretation of sputtering yield data for Bi thin films irradiated by MeV 84Kr15+ ions
 
 
Title: Thermal spike model interpretation of sputtering yield data for Bi thin films irradiated by MeV 84Kr15+ ions
Author: Mammeri, S.
Ouichaoui, S.
Ammi, H.
Pineda-Vargas, C.A.
Dib, A.
Msimanga, M.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 354 (2015) nr. C pages 5 p.
Year: 2015
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 73 of 77 found articles
 
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