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Journal description
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Details for article 45 of 74 found articles
| Title: |
Interface state generation of Al2O3/InGaAs MOS structures by electrical stress |
| Author: |
Yoon, S.-H. Chang, C.-Y. Ahn, D.-H. Takenaka, M. Takagi, S. |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 178 (2017) nr. C pages 313-317 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 45 of 74 found articles
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