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Journal description
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Details for article 13 of 74 found articles
| Title: |
Demonstration of 2e12cm−2 eV−1 2D-oxide interface trap density on back-gated MoS2 flake devices with 2.5nm EOT |
| Author: |
Gaur, A. Balaji, Y. Lin, D. Adelmann, C. Van Houdt, J. Heyns, M. Mocuta, D. Radu, I. |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 178 (2017) nr. C pages 145-149 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 74 found articles
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