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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 9 of 12 found articles
| Title: |
Ruggedness analysis of 3.3kV high voltage diodes considering various buffer structures and edge terminations |
| Author: |
Heinze, B. Lutz, J. Felsl, H.P. Schulze, H.-J. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 39 () nr. 6 pages 868-877 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 12 found articles
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