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Journal description
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Details for article 11 of 12 found articles
| Title: |
The degradation of p-MOSFETs under off-state stress |
| Author: |
Yang, Cunyu Wang, Ziou Tan, Changhua Xu, Mingzhen |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 32 () nr. 7 pages 587-591 |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 12 found articles
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