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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 48 of 215 found articles
| Title: |
Depth profile measurements of Pt x si x layers by combined SIMS, SNMS, AES and XPS |
| Author: | |
| Appeared in: |
Vacuum |
| Paging: | Volume 41 (1990) nr. 7-9 pages 2 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 48 of 215 found articles
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