|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 9 of 10 found articles
| Title: |
Performance reliability of ultra-thin Si-SiO2, Si-Al2O3, Si-ZrO2 and Si-HfO2 interface in rectangular steep retrograded nano-regimes devices |
| Author: |
Thakur, Rajiv Ranjan Singh, Pragati |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 96 (2019) nr. C pages 21-28 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 10 found articles
| << previous | next >> |