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                                       Details for article 6 of 12 found articles
 
 
  Effects of total ionizing dose on single event effect sensitivity of FRAMs
 
 
Title: Effects of total ionizing dose on single event effect sensitivity of FRAMs
Author: Ji, Qinggang
Liu, Jie
Li, Dongqing
Liu, Tianqi
Ye, Bing
Zhao, Peixiong
Sun, Youmei
Appeared in: Microelectronics reliability
Paging: Volume 95 (2019) nr. C pages 1-7
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 12 found articles
 
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