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Journal description
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Details for article 4 of 8 found articles
| Title: |
Generalized closed form approximations for pull-in characteristics of fixed-fixed nano beam under the influences of van der Waals and Casimir forces |
| Author: |
Mukherjee, Banibrata Sen, Siddhartha |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 94 (2019) nr. C pages 32-40 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 8 found articles
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