|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 23 found articles
| Title: |
Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length |
| Author: |
Kim, Junyeap Yoo, Hanbin Lee, Heesung Kim, Seong Kwang Choi, Sungju Choi, Sung-Jin Kim, Dae Hwan Kim, Dong Myong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 85 (2018) nr. C pages 66-70 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 23 found articles
| << previous | next >> |