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Journal description
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Details for article 5 of 23 found articles
| Title: |
Comphy — A compact-physics framework for unified modeling of BTI |
| Author: |
Rzepa, G. Franco, J. O’Sullivan, B. Subirats, A. Simicic, M. Hellings, G. Weckx, P. Jech, M. Knobloch, T. Waltl, M. Roussel, P.J. Linten, D. Kaczer, B. Grasser, T. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 85 (2018) nr. C pages 49-65 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 23 found articles
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