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Journal description
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Details for article 39 of 40 found articles
| Title: |
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs |
| Author: |
Tuan, Fu-Yuan Chen, Chii-Wen Wang, Mu-Chun Liao, Wen-Shiang Wang, Shea-Jue Fan, Shou-Kong Lan, Wen-How |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 83 (2018) nr. C pages 260-270 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 40 found articles
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