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Journal description
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Details for article 24 of 46 found articles
| Title: |
Investigating the TDDB lifetime growth mechanism caused by proton irradiation in partially depleted SOI devices |
| Author: |
Ma, Teng Yu, Xuefeng Cui, Jiangwei Zheng, Qiwen Zhou, Hang Su, Dandan Guo, Qi |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 81 (2018) nr. C pages 112-116 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 46 found articles
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