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Journal description
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Details for article 23 of 46 found articles
| Title: |
Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20nm modern integrated circuits |
| Author: |
Ahn, W. Shin, S.H. Jiang, C. Jiang, H. Wahab, M.A. Alam, M.A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 81 (2018) nr. C pages 262-273 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 46 found articles
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