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Journal description
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Details for article 40 of 55 found articles
| Title: |
Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component |
| Author: |
Tang, Hongyu Ye, Huaiyu Wong, Cell K.Y. Leung, Stanely Y.Y. Fan, Jiajie Chen, Xianping Fan, Xuejun Zhang, Guoqi |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 78 (2017) nr. C pages 8 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 40 of 55 found articles
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