|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 81 of 136 found articles
| Title: |
Investigating stress measurement capabilities of GHz Scanning Acoustic Microscopy for 3D failure analysis |
| Author: |
Khaled, A. Brand, S. Kögel, M. Appenroth, T. De Wolf, I. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 64 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 81 of 136 found articles
| << previous | next >> |