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                                       Details for article 24 of 136 found articles
 
 
  Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures
 
 
Title: Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures
Author: Broas, M.
Graff, A.
Simon-Najasek, M.
Poppitz, D.
Altmann, F.
Jung, H.
Blanck, H.
Appeared in: Microelectronics reliability
Paging: Volume 64 (2016) nr. C pages 6 p.
Year: 2016
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 24 of 136 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands