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Journal description
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Details for article 29 of 46 found articles
| Title: |
Modeling of data retention statistics of phase-change memory with confined- and mushroom-type cells |
| Author: |
Kwon, Yongwoo Park, Byoungnam Yang, Heesun Hwang, Jin-Ha Kang, Dae-Hwan Jeong, Hongsik Song, Yunheub |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 63 (2016) nr. C pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 46 found articles
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