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Journal description
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Details for article 11 of 46 found articles
| Title: |
Drop-shock reliability improvement of embedded chip resistor packages through via structure modification |
| Author: |
Park, Se-Hoon Park, Jong Chul Park, Jae-Yong Kim, Young-Ho |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 63 (2016) nr. C pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 46 found articles
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