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Journal description
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Details for article 10 of 46 found articles
| Title: |
Drain current model for short-channel triple gate junctionless nanowire transistors |
| Author: |
Paz, B.C. Cassé, M. Barraud, S. Reimbold, G. Faynot, O. Ávila-Herrera, F. Cerdeira, A. Pavanello, M.A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 63 (2016) nr. C pages 10 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 46 found articles
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