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Journal description
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Details for article 49 of 117 found articles
| Title: |
Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology |
| Author: |
Liu, R. Schreurs, D. De Raedt, W. Vanaverbeke, F. Das, J. Mertens, R. De Wolf, I. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 9-11 pages 4 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 49 of 117 found articles
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