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Journal description
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Details for article 6 of 24 found articles
| Title: |
Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness |
| Author: |
Poliakov, Pavel Blomme, Pieter Corbalan, Miguel Miranda Houdt, Jan Van Dehaene, Wim |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 5 pages 6 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 24 found articles
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