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Journal description
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Details for article 7 of 140 found articles
| Title: |
Ageing effect on electromagnetic susceptibility of a phase locked loop |
| Author: |
Li, B. Boyer, A. Bendhia, S. Lemoine, C. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 9-11 pages 5 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 140 found articles
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