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Journal description
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Details for article 1 of 24 found articles
| Title: |
A study of the linearity between I on and log I off of modern MOS transistors and its application to stress engineering |
| Author: |
Lau, W.S. Yang, Peizhen Eng, C.W. Ho, V. Loh, C.H. Siah, S.Y. Vigar, D. Chan, L. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 48 (2008) nr. 4 pages 7 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 24 found articles
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