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Journal description
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Details for article 22 of 46 found articles
| Title: |
FEM-based method to determine mechanical stress evolution during process flow in microelectronics, application to stress–voiding |
| Author: |
Orain, S. Barbé, J.-C. Federspiel, X. Legallo, P. Jaouen, H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 2-3 pages 7 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 46 found articles
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