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Journal description
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Details for article 4 of 25 found articles
| Title: |
A thorough investigation of MOSFETs NBTI degradation |
| Author: |
Huard, V. Denais, M. Perrier, F. Revil, N. Parthasarathy, C. Bravaix, A. Vincent, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 45 (2005) nr. 1 pages 16 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 25 found articles
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