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Journal description
All volumes of the corresponding journal
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Details for article 10 of 21 found articles
| Title: |
Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5–2 nm thick gate-oxides |
| Author: |
Bravaix, A. Goguenheim, D. Revil, N. Vincent, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 1 pages 13 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 21 found articles
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