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Details for article 50 of 110 found articles
| Title: |
High-resolution SILC measurements of thin SiO2 at ultra low voltages |
| Author: |
Aresu, S. De Ceuninck, W. Dreesen, R. Croes, K. Andries, E. Manca, J. De Schepper, L. Degraeve, R. Kaczer, B. D’Olieslaeger, M. D’Haen, J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 9-11 pages 5 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 50 of 110 found articles
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