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                                       Details for article 51 of 110 found articles
 
 
  How reliable are reliability tests?
 
 
Title: How reliable are reliability tests?
Author: Tielemans, L.
Rongen, R.
De Ceuninck, W.
Appeared in: Microelectronics reliability
Paging: Volume 42 (2002) nr. 9-11 pages 7 p.
Year: 2002
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 51 of 110 found articles
 
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