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Journal description
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Details for article 6 of 37 found articles
| Title: |
Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4–3 nm) |
| Author: |
Clerc, R. Spinelli, A.S. Ghibaudo, G. Leroux, C. Pananakakis, G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 7 pages 4 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 37 found articles
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