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Journal description
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Details for article 12 of 15 found articles
| Title: |
Long-term base current instability in AlGaAs/GaAs HBTs: physical mechanisms, modeling, and SPICE simulation |
| Author: |
Liou, J.J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 5 pages 17 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 15 found articles
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