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Journal description
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Details for article 25 of 26 found articles
| Title: |
The effects of SiO2 barrier between active layer and substrate on the performance and reliability of polycrystalline silicon thin film transistors |
| Author: |
Wang, Y.Z Awadelkarim, O.O |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 12 pages 12 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 26 found articles
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