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Journal description
All volumes of the corresponding journal
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Details for article 24 of 26 found articles
| Title: |
The effects of process induced gate-to-source/drain junction separation in MOSFET structures |
| Author: |
Rowlands, David Dimitrijev, Sima Harrison, H.Barry |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 12 pages 12 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 26 found articles
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