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                                       Details for article 5 of 18 found articles
 
 
  Experimental analysis of NBTI effects on QDI circuits with resistive bridging faults
 
 
Title: Experimental analysis of NBTI effects on QDI circuits with resistive bridging faults
Author: Lamine, Zina
Ait Abdelmalek, Ghania
Ziani, Rezki
Mokdad, Rabah
Appeared in: Microelectronics reliability
Paging: Volume 163 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 18 found articles
 
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