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Journal description
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Details for article 14 of 18 found articles
| Title: |
The effect of oxide scaling on ionising radiation response of sense-switch flash cells |
| Author: |
Shi, Hui Wang, Yinquan Cao, Lichao Hong, Genshen Zheng, Ruocheng Xu, Hejun Wang, Yi Xie, Rubin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 163 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 18 found articles
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