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Journal description
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Details for article 6 of 16 found articles
| Title: |
Enhanced gate biasing resilience in asymmetric and double trench SiC MOSFETs towards generalized highly reliable power electronics |
| Author: |
Wang, Dandan Zhang, Yifan Wang, Ruolan Tang, Ruifeng Wang, Kuan Wang, Di Liu, Long Yan, Feng Zhang, Songsong Shen, Andy Mai, Zhihong Xing, Guozhong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 154 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 16 found articles
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